Vulnerability CVE-2019-20607

Vulnerability Name:

CVE-2019-20607 (CCN-178468)

Assigned:

2020-03-23

Published:

2020-03-23

Updated:

2020-03-30

Summary:

An issue was discovered on Samsung mobile devices with N(7.x), O(8.x), and P(9.0) (MSM8996, MSM8998, Exynos7420, Exynos7870, Exynos8890, and Exynos8895 chipsets) software. A heap overflow in the keymaster Trustlet allows attackers to write to TEE memory, and achieve arbitrary code execution. The Samsung ID is SVE-2019-14126 (May 2019).

CVSS v3 Severity:

9.8 Critical (CVSS v3.1 Vector: CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H)
8.5 High (Temporal CVSS v3.1 Vector: CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H/E:U/RL:O/RC:C)

Exploitability Metrics:	Attack Vector (AV): Network Attack Complexity (AC): Low Privileges Required (PR): None User Interaction (UI): None
Scope:	Scope (S): Unchanged
Impact Metrics:	Confidentiality (C): High Integrity (I): High Availibility (A): High

8.4 High (CCN CVSS v3.1 Vector: CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H)
7.3 High (CCN Temporal CVSS v3.1 Vector: CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H/E:U/RL:O/RC:C)

Exploitability Metrics:	Attack Vector (AV): Local Attack Complexity (AC): Low Privileges Required (PR): None User Interaction (UI): None
Scope:	Scope (S): Unchanged
Impact Metrics:	Confidentiality (C): High Integrity (I): High Availibility (A): High

CVSS v2 Severity:

10.0 High (CVSS v2 Vector: AV:N/AC:L/Au:N/C:C/I:C/A:C)

Exploitability Metrics:	Access Vector (AV): Network Access Complexity (AC): Low Authentication (Au): None
Impact Metrics:	Confidentiality (C): Complete Integrity (I): Complete Availibility (A): Complete

7.2 High (CCN CVSS v2 Vector: AV:L/AC:L/Au:N/C:C/I:C/A:C)

Exploitability Metrics:	Access Vector (AV): Local Access Complexity (AC): Low Athentication (Au): None
Impact Metrics:	Confidentiality (C): Complete Integrity (I): Complete Availibility (A): Complete